Rietveld refinement guidelines

Journal of Applied Crystallography

Volumn 32, Issue 1, 1999, Pages 36-50

  Mccusker, L B ^a   Von Dreele, R B ^b   Cox, D E ^c   Louer D ^d   Scardi, P ^e  

^a ETH ZURICH   (Switzerland)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d UNIVERSITÉ DE RENNES 1   (France)

^e UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 16344364839     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898009856     Document Type: Article

References (10)

1. Altomare, A., Burla, M. C., Cascarano, G., Giacovazzo, C., Guagliardi, A., Moliterni, A. G. G. & Polidori, G. (1996). J. Appl. Cryst. 29, 341-345.
2. Altomare, A., Cascarano, G., Giacovazzo, C., Guagliardi, A., Moliterni, A. G. G., Burla, M. C. & Polidori, G. (1995). J. Appl. Cryst. 28, 738-744.
3. Antoniadis, A., Berruyer, J. & Filhol, A. (1990). Acta Cryst. A46, 692-711.
4. Järvinen, M. J. (1993). J. Appl. Cryst. 26, 525-531.
5. Kumazawa, S., Kubota, Y., Takata, M., Sakata, M. & Ishibashi, Y. (1993). J. Appl. Cryst. 26, 453-457.
6. Langford, J. I. & Louër, D. (1996). Rep. Prog. Phys. 59, 131-234.
7. Le Bail, A. (1998). In Microstructure Analysis by Diffraction, edited by H. Bunge, J. Fiala & R. L. Snyder. IUCr/Oxford University Press. In preparation.
8. Le Bail, A., Duroy, H. & Fourquet, J. L. (1988). Mater. Res. Bull. 23, 447-452.
9. Louër, D. & Langford, J. I. (1988). J. Appl. Cryst. 21, 430-437.
10. Madsen, I. C. & Hill, R. J. (1994). J. Appl. Cryst. 27, 385-392.