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Zeitschrift fur Kristallographie

Volumn 217, Issue 7-8, 2002, Pages 420-421

Profile modelling versus profile fitting in powder diffraction

(1) Scardi, P a

a UNIVERSITY OF TRENTO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATION; COMPUTER PROGRAM; CRYSTALLOGRAPHY; DEVICE; FOURIER TRANSFORMATION; MATHEMATICAL ANALYSIS; METHODOLOGY; NEUTRON; PARAMETER; SHORT SURVEY; STRUCTURE ANALYSIS; SYNCHROTRON RADIATION; X RAY POWDER DIFFRACTION;

EID: 0036397262 PISSN: 00442968 EISSN: None Source Type: Journal
DOI: 10.1524/zkri.217.7.420.23656 Document Type: Short Survey

Times cited : (14)

References (14)

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5
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- Wilkens, M.: Phys. Stat. Sol. (a) 2 (1970) 359; Wilkens, M.: In: Fundamental Aspects of Dislocation Theory (Eds. J. A. Simmons, R. de Wit, R. Bullough), Vol. II. Washington DC: Nat. Bur. Stand. (US) Spec. Publ. No 317, p. 1195 (1970).
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- Wilkens, M.¹

6
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- Wilkens, M.: Phys. Stat. Sol. (a) 2 (1970) 359; Wilkens, M.: In: Fundamental Aspects of Dislocation Theory (Eds. J. A. Simmons, R. de Wit, R. Bullough), Vol. II. Washington DC: Nat. Bur. Stand. (US) Spec. Publ. No 317, p. 1195 (1970).
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7
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- Scardi, P.; Leoni, M.; Dong, Y. H.: CPD Newsletter 24 (2001) 23.
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- Scardi, P.¹ Leoni, M.²

14
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- Leoni, M.; Scardi, P.: In: Diffraction Analysis of Materials Microstructure (Ed. P. Scardi, E. J. Mittemeijer). Berlin: Springer-Verlag. In preparation.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.