MarqX: A new program for whole-powder-pattern fitting

Journal of Applied Crystallography

Volumn 33, Issue 1, 2000, Pages 184-189

  Dong, Y H ^a   Scardi, P ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; COMPUTER PROGRAM; DECOMPOSITION; GONIOMETRY; INTERMETHOD COMPARISON; MATHEMATICAL ANALYSIS; PARAMETER; SPECTROMETRY; X RAY POWDER DIFFRACTION;

EID: 0034483587     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188989901434X     Document Type: Article

References (13)

1. Ahtee, M., Unonius, L., Nurmela, M. & Suortti, P. (1984). J. Appl. Cryst. 17, 352.
2. Antonucci, P. L. (1999). Unpublished results.
3. Audebrand, N. & Louër, D. (1998). J. Phys. IV Fr. 8, 109.
4. Caglioti, G., Paoletti, A. & Ricci, F. P. (1958). Nucl. Instrum. 3, 223-234.
5. Garbow, B. S., Hillstrom, K. E. & More, J. J. (1996). MINPACK Project. Argonne National Laboratory, November 1996 (http:www.netlib.Org/minpack).
6. Klug, H. P. & Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. New York: Wiley.
7. Langford, J. I. (1992). Accuracy in Powder Diffraction II, NIST Special Publication 846, edited by E. Prince & J. K. Stalick, pp. 110-126. Washington: USG Printing Office.
8. Warren, B. E. (1969). X-ray Diffraction. Reading, MA: Addison-Wesley.
9. Warren, B. E. & Averbach, B. L. (1950). J. Appl. Phys. 21, 595-599.
10. Warren, B. E. & Averbach, B. L. (1952). J. Appl. Phys. 23, 497-502.
11. Wertheim, G. K., Butler, M. A., West, K. W. & Buchanan, D. N. E. (1974). Rev. Sci. Instrum. 45, 1369-1371.
12. Yoder-Short, Y. (1993). J. Appl. Cryst. 26, 272-276.
13. Young, R. A. (1993). Editor. The Rietveld Method. Oxford University Press.