Line Broadening Analysis Using Fullprof: Determination of Microstructural Properties

Materials Science Forum

Volumn 443-444, Issue , 2004, Pages 123-126

  Rodriguez Carvajal J ^a,b   Roisnel, T ^c  

^a DIF   (France)

^b CEA GRENOBLE   (France)

^c UNIVERSITÉ DE RENNES 1   (France)

Author keywords

Instrumental Resolution Function; Line Broadening; Microstructural Properties; Voigt Function

Indexed keywords

ANISOTROPY; APPROXIMATION THEORY; CRYSTAL DEFECTS; FUNCTIONS; PARTICLE SIZE ANALYSIS; POWDERS; STRAIN;

INSTRUMENTAL RESOLUTION FUNCTION; LINE BROADENING; MICROSTRUCTURAL PROPERTIES; VOIGT FUNCTION;

MICROSTRUCTURE;

EID: 0842326602     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

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