Structural and compositional comparison of Si3N4 ceramics with different fracture modes

Acta Materialia

Volumn 54, Issue 7, 2006, Pages 1949-1956

  Doblinger M ^a,c   Winkelman, G B ^a   Dwyer, C ^a   Marsh, C ^a   Kirkland, A I ^a   Cockayne, D J H ^a   Hoffmann, M J ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF KARLSRUHE   (Germany)

^c UNIVERSITY OF MUNICH   (Germany)

Author keywords

Energy dispersive X ray spectroscopy; High resolution electron microscopy; Interface structure; Si3N4

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; FRACTURE; GLASS; SILICON COMPOUNDS; THIN FILMS;

HIGH-RESOLUTION ELECTRON MICROSCOPY; INTERFACE STRUCTURE; SI3N4;

CERAMIC MATERIALS;

EID: 33644892169     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.12.016     Document Type: Article

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