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Volumn 200, Issue 14-15, 2006, Pages 4291-4299

Heat treatment of nanocrystalline TiN films deposited by unbalanced magnetron sputtering

Author keywords

Heat treatment; Residual stress; TiN; Unbalanced magnetron sputtering

Indexed keywords

CRYSTAL MICROSTRUCTURE; HEAT TREATMENT; KINETIC ENERGY; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; OXIDATION; RESIDUAL STRESSES; SILICON WAFERS; SURFACE ROUGHNESS; TEXTURES; THERMODYNAMICS; THIN FILMS;

EID: 33644700171     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2005.02.147     Document Type: Article
Times cited : (35)

References (33)
  • 17
    • 0004133128 scopus 로고
    • Residual Stress Measurement by Diffraction and Interpolation
    • New York: Spring-Verlag
    • I.C. Noyan J.B. Cohen Residual Stress Measurement by Diffraction and Interpolation 1987 Spring-Verlag New York
    • (1987)
    • Noyan, I.C.1    Cohen, J.B.2
  • 19
    • 0003938188 scopus 로고
    • Metallurgical Thermochemistry
    • 4th ed. Pergamon New York
    • O. Kubaschewski L.L. Evans C.B. Alcock Metallurgical Thermochemistry 4th ed. 1967 Pergamon New York 428
    • (1967) , pp. 428
    • Kubaschewski, O.1    Evans, L.L.2    Alcock, C.B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.