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Volumn 138, Issue 2-3, 2001, Pages 237-241

Annealing studies of TiN films deposited by plasma-assisted CVD

Author keywords

Annealing treatment; Plasma assisted CVD; TiN film

Indexed keywords

ANNEALING; COMPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; LATTICE CONSTANTS; MICROHARDNESS; MICROSTRUCTURE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; TITANIUM NITRIDE; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0035897250     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(00)01138-5     Document Type: Article
Times cited : (22)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.