Shaping electrical field in heterostructure transistors

Microelectronics Journal

Volumn 36, Issue 3-6, 2005, Pages 319-322

  Mil'shtein, S ^a  

^a University of Massachusetts   (United States)

Author keywords

Electrical field profile; Field plates; HEMT

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; ELECTRIC NETWORK TOPOLOGY; ELECTRON MOBILITY; NATURAL FREQUENCIES;

ELECTRICAL FIELD PROFILE; FIELD PLATES; HEMT CHANNEL; MULTI-GATE TRANSISTORS;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 33644533842     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2005.02.053     Document Type: Conference Paper

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