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Volumn 289, Issue 1, 2006, Pages 140-144

Crystal growth and characterization of thick GaN layers grown by oxide vapor transport technique

Author keywords

A1. X ray topography; A2. Growth from vapor; B1. Gallium compounds; B1. Nitrides; B2. Semiconducting gallium compounds

Indexed keywords

AMMONIA; GALLIUM NITRIDE; GRAPHITE; NITROGEN COMPOUNDS; OXIDES; SCANNING ELECTRON MICROSCOPY; VAPORS; X RAY DIFFRACTION ANALYSIS;

EID: 33244465370     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.11.005     Document Type: Article
Times cited : (18)

References (24)
  • 17
    • 33244490889 scopus 로고    scopus 로고
    • private communication
    • Dr. Yuri Makarov, private communication.
    • Makarov, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.