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Volumn 289, Issue 1, 2006, Pages 140-144
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Crystal growth and characterization of thick GaN layers grown by oxide vapor transport technique
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Author keywords
A1. X ray topography; A2. Growth from vapor; B1. Gallium compounds; B1. Nitrides; B2. Semiconducting gallium compounds
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Indexed keywords
AMMONIA;
GALLIUM NITRIDE;
GRAPHITE;
NITROGEN COMPOUNDS;
OXIDES;
SCANNING ELECTRON MICROSCOPY;
VAPORS;
X RAY DIFFRACTION ANALYSIS;
GRAPHITE POWDER;
GROWTH FROM VAPOR;
NITROGEN CARRIER GAS;
X-RAY TOPOGRAPHY;
CRYSTAL GROWTH;
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EID: 33244465370
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2005.11.005 Document Type: Article |
Times cited : (18)
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References (24)
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