Data analysis of the extraction of dielectric properties from insulating substrates utilizing the evanescent perturbation method

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 2, 2006, Pages 522-531

  Inoue, Ryotaro ^a,b,e,f   Odate, Yasuhiko ^a,c,g   Tanabe, Eiji ^a,c,h,i,j   Kitano, Haruhisa ^d,e,f,k   Maeda, Atsutaka ^d,e,f,k  

^a IEEE   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c AET Japan Inc   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

^e JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

^f National Laboratory for High Energy Physics   (Japan)

^g Institute of Electronics   (Japan)

^h Institute of Electrical   (Japan)

ⁱ International Electrotechnical Commission

^j JASTRO ^*

^k AMERICAN PHYSICAL SOCIETY   (United States)

more..

Author keywords

Coaxial resonators; Dielectric materials; Electromagnetic fields; Microwave measurements; Numerical analysis

Indexed keywords

COAXIAL RESONATORS; GEOMETRIC FACTORS; INSULATING SUBSTRATES; MICROWAVE MEASUREMENTS;

DIELECTRIC MATERIALS; ELECTROMAGNETIC FIELDS; EXTRACTION; NUMERICAL ANALYSIS; PERTURBATION TECHNIQUES; RESONATORS; SUBSTRATES;

DATA REDUCTION;

EID: 33144488441     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.862707     Document Type: Article

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