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Volumn 52, Issue 9 I, 2004, Pages 2163-2168

Highly accurate and real-time determination of resonant characteristics: Complex linear regression of the transmission coefficient

Author keywords

Error analysis; Least squares methods; Microwave measurements; Microwave resonators; Scattering parameters

Indexed keywords

ALGORITHMS; BANDWIDTH; COMPUTER SIMULATION; ERROR ANALYSIS; LEAST SQUARES APPROXIMATIONS; MICROWAVE MEASUREMENT; NATURAL FREQUENCIES; REGRESSION ANALYSIS; SCATTERING PARAMETERS;

EID: 4544375758     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.834183     Document Type: Conference Paper
Times cited : (13)

References (22)
  • 3
    • 4544328955 scopus 로고
    • A general theory of ultra-short wave circuits I
    • S. Tomonaga, "A general theory of ultra-short wave circuits I," J. Phys. Soc. Jpn., vol. 2, pp. 158-171, 1947.
    • (1947) J. Phys. Soc. Jpn. , vol.2 , pp. 158-171
    • Tomonaga, S.1
  • 4
    • 4544328101 scopus 로고
    • A general theory of ultra-short wave circuits II
    • _, "A general theory of ultra-short wave circuits II," J. Phys. Soc. Jpn., vol. 3, pp. 93-105, 1948.
    • (1948) J. Phys. Soc. Jpn. , vol.3 , pp. 93-105
  • 5
    • 0036733119 scopus 로고    scopus 로고
    • Precise measurements of the Q factor of dielectric resonators in the transmission mode-accounting for noise, crosstalk, delay of uncalibrated lines, coupling loss, and coupling reactance
    • Sept.
    • K. Leong and J. Mazierska, "Precise measurements of the Q factor of dielectric resonators in the transmission mode-accounting for noise, crosstalk, delay of uncalibrated lines, coupling loss, and coupling reactance," IEEE Trans. Microwave Theory Tech., vol. 50, pp. 2115-2127, Sept. 2002.
    • (2002) IEEE Trans. Microwave Theory Tech. , vol.50 , pp. 2115-2127
    • Leong, K.1    Mazierska, J.2
  • 6
    • 0344940344 scopus 로고
    • Q factor
    • Univ. Mississippi, University, MS
    • D. Kajfez, "Q factor," Vector Fields, Univ. Mississippi, University, MS, 1994.
    • (1994) Vector Fields
    • Kajfez, D.1
  • 7
    • 4544349692 scopus 로고    scopus 로고
    • "Rept. 5552," Ph.D. dissertation, Ginzton Labs., Stanford Univ., Stanford, CA
    • H. J. Snortland, "Rept. 5552," Ph.D. dissertation, Ginzton Labs., Stanford Univ., Stanford, CA, 1997.
    • (1997)
    • Snortland, H.J.1
  • 8
    • 4544247550 scopus 로고
    • "Rep. 5298," Ph.D. dissertation, Ginzton Labs., Stanford Univ., Stanford, CA
    • Z. Ma, "Rep. 5298," Ph.D. dissertation, Ginzton Labs., Stanford Univ., Stanford, CA, 1995.
    • (1995)
    • Ma, Z.1
  • 9
    • 0000883694 scopus 로고    scopus 로고
    • Measurement of resonant frequency and quality factor of microwave resonators: Comparison of methods
    • P. J. Petersan and S. M. Anlage, "Measurement of resonant frequency and quality factor of microwave resonators: Comparison of methods," J. Appl. Phys., vol. 84, no. 6, pp. 3392-3402, 1998.
    • (1998) J. Appl. Phys. , vol.84 , Issue.6 , pp. 3392-3402
    • Petersan, P.J.1    Anlage, S.M.2
  • 10
    • 84928809109 scopus 로고
    • A dielectric resonator method of measuring inductive capacities in the millimeter range
    • July
    • B. W. Hakki and P. D. Coleman, "A Dielectric resonator method of measuring inductive capacities in the millimeter range," in IRE Trans. Microwave Theory Tech., vol. MTT-8, July 1960, pp. 402-410.
    • (1960) IRE Trans. Microwave Theory Tech. , vol.MTT-8 , pp. 402-410
    • Hakki, B.W.1    Coleman, P.D.2
  • 11
    • 0014829002 scopus 로고
    • Analysis and evaluation of a method of measuring the complex permittivity and permeability microwave insulators
    • Aug.
    • W. E. Courtney, "Analysis and evaluation of a method of measuring the complex permittivity and permeability microwave insulators," IEEE Trans. Microwave Theory Tech., vol. MTT-18, pp. 476-485, Aug. 1970.
    • (1970) IEEE Trans. Microwave Theory Tech. , vol.MTT-18 , pp. 476-485
    • Courtney, W.E.1
  • 12
    • 0022100780 scopus 로고
    • Microwave measurement of dielectric properties of low-loss materials by the dielectric rod resonator method
    • July
    • Y. Kobayashi and M. Katoh, "Microwave measurement of dielectric properties of low-loss materials by the dielectric rod resonator method," IEEE Trans. Microwave Theory Tech., vol. MTT-33, pp. 586-592, July 1985.
    • (1985) IEEE Trans. Microwave Theory Tech. , vol.MTT-33 , pp. 586-592
    • Kobayashi, Y.1    Katoh, M.2
  • 13
    • 0027812087 scopus 로고
    • Microwave cavity perturbation technique: Part I: Principles
    • O. Klein, S. Donovan, M. Dressel, and G. Grüner, "Microwave cavity perturbation technique: Part I: Principles," Int. J. Infrared Millim. Waves, vol. 14, no. 12, pp. 2423-2458, 1993.
    • (1993) Int. J. Infrared Millim. Waves , vol.14 , Issue.12 , pp. 2423-2458
    • Klein, O.1    Donovan, S.2    Dressel, M.3    Grüner, G.4
  • 14
  • 15
    • 0027797973 scopus 로고
    • Microwave cavity perturbation technique: Part III: Applications
    • M. Dressel, O. Klein, S. Donovan, and G. Grüner, "Microwave cavity perturbation technique: Part III: Applications," Int. J. Infrared Millim. Waves, vol. 14, no. 12, pp. 2489-2517, 1993.
    • (1993) Int. J. Infrared Millim. Waves , vol.14 , Issue.12 , pp. 2489-2517
    • Dressel, M.1    Klein, O.2    Donovan, S.3    Grüner, G.4
  • 16
    • 0000116746 scopus 로고    scopus 로고
    • Quantitative microwave near-field microscopy of dielectric properties
    • C. Gao and X.-D. Xiang, "Quantitative microwave near-field microscopy of dielectric properties," Rev. Sci. Instrum., vol. 69, no. 11, pp. 3846-3851, 1998.
    • (1998) Rev. Sci. Instrum. , vol.69 , Issue.11 , pp. 3846-3851
    • Gao, C.1    Xiang, X.-D.2
  • 18
    • 0033314088 scopus 로고    scopus 로고
    • Evanescent microwaves: A novel super-resolution noncontact nondestructive imaging technique for biological applications
    • Dec.
    • M. Tabib-Azar, J. L. Katz, and S. R. LeClair, "Evanescent microwaves: A novel super-resolution noncontact nondestructive imaging technique for biological applications," IEEE Trans. Instrum. Meas., vol. 48, pp. 1111-1116, Dec. 1999.
    • (1999) IEEE Trans. Instrum. Meas. , vol.48 , pp. 1111-1116
    • Tabib-Azar, M.1    Katz, J.L.2    Leclair, S.R.3
  • 19
    • 0344940333 scopus 로고
    • Methods for determination of microwave cavity quality factors from equivalent electronic circuit models
    • K. D. McKinstry and C. E. Patton, "Methods for determination of microwave cavity quality factors from equivalent electronic circuit models," Rev. Sci. Instrum., vol. 60, no. 3, pp. 439-443, 1989.
    • (1989) Rev. Sci. Instrum. , vol.60 , Issue.3 , pp. 439-443
    • McKinstry, K.D.1    Patton, C.E.2
  • 20
    • 0025473111 scopus 로고
    • Unified and simplified treatment of techniques for characterising transmission, reflection or absorption resonators
    • M. C. Sanchez, E. Martin, and J. M. Zamarro, "Unified and simplified treatment of techniques for characterising transmission, reflection or absorption resonators," Proc. Inst. Elect. Eng., pt. H, vol. 137, no. 4, pp. 209-212, 1990.
    • (1990) Proc. Inst. Elect. Eng., Pt. H , vol.137 , Issue.4 , pp. 209-212
    • Sanchez, M.C.1    Martin, E.2    Zamarro, J.M.3
  • 21
    • 0024641284 scopus 로고
    • New vectorial automatic technique for characterisation of resonators
    • _, "New vectorial automatic technique for characterisation of resonators," Proc. Inst. Elect. Eng., pt. H, vol. 136, no. 2, pp. 147-150, 1989.
    • (1989) Proc. Inst. Elect. Eng., Pt. H , vol.136 , Issue.2 , pp. 147-150


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.