Open-ended coaxial probe for high-temperature and broad-band dielectric measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 47, Issue 9 PART 1, 1999, Pages 1640-1648

  Gershon, David L ^a,b   Calame, J P ^b   Carmel, Y ^c   Antonsen Jr , T M ^d   Hutcheon, Ron M ^c  

^a IEEE   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

^d Microwave Properties North   (Canada)

Author keywords

Coaxial probe; High temperature; Permittivity measurements

Indexed keywords

COAXIAL CABLES; HIGH TEMPERATURE PROPERTIES; PERMITTIVITY MEASUREMENT; STANDARDS;

OPEN ENDED COAXIAL PROBES;

PROBES;

EID: 0033360283     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.788604     Document Type: Article

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