Analysis of 1/f noise in CMOS preamplifier with CDS circuit

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1819-1823

  Lee, Tae Hoon ^a   Cho, Gyuseong ^a   Kim, Hee Joon ^a   Lee, Seung Wook ^a   Lee, Wanno ^a   Han, Sang Hyo ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Kyungpook National University   (South Korea)

Author keywords

1 f noise; CDS circuit

Indexed keywords

ACOUSTIC NOISE; AMPLIFIERS (ELECTRONIC); BANDWIDTH; NOISE ABATEMENT; RADIATION DETECTORS;

CHARGE SENSITIVE PREAMPLIFIERS (CSA);

CMOS INTEGRATED CIRCUITS;

EID: 0036703165     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801514     Document Type: Article

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