Submicron CMOS technologies for low-noise analog front-end circuits

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1783-1790

  Manghisoni, M ^a   Ratti, L ^b   Re, V ^a   Speziali, V ^b  

^a UNIVERSITY OF BERGAMO   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

Author keywords

Deep submicron; Front end electronics; MOSFET; Noise

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC POTENTIAL; IONIZING RADIATION; SPURIOUS SIGNAL NOISE; TRANSISTORS;

ANALOG FRONT END CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 0036703088     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801540     Document Type: Article

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