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Volumn 5964, Issue , 2005, Pages

High-resolution FPAs on MBE-grown HgCdTe/CdTe/Ge

Author keywords

HgCdTe; MBE; Third generation

Indexed keywords

CHARACTERIZATION; COMPOSITE MATERIALS; FABRICATION; HETEROJUNCTIONS; MERCURY COMPOUNDS; SUBSTRATES;

EID: 33144454425     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.637514     Document Type: Conference Paper
Times cited : (2)

References (19)
  • 1
    • 0742306724 scopus 로고    scopus 로고
    • Les nouvelles generations de détecteurs infrarouge à base de HgCdTe
    • « Les nouvelles generations de détecteurs infrarouge à base de HgCdTe », C.R. Physique 4, 1109-1120, (2003).
    • (2003) C.R. Physique , vol.4 , pp. 1109-1120
  • 5
    • 33144471625 scopus 로고    scopus 로고
    • Wollam Inc., 645 M Street, Suite 102, Lincoln, NE 68508 USA
    • Wollam Inc., 645 M Street, Suite 102, Lincoln, NE 68508 USA.
  • 6
    • 0037382872 scopus 로고    scopus 로고
    • Accuracy of the in situ determination of the CdZnTe temperature by ellipsometry before the growth of HgCdTe by MBE
    • G. Badano, J. W. Garland, S. Sivananthan, "Accuracy of the in situ determination of the CdZnTe temperature by ellipsometry before the growth of HgCdTe by MBE" J. Cryst. Growth, 251 (2003) 571-575.
    • (2003) J. Cryst. Growth , vol.251 , pp. 571-575
    • Badano, G.1    Garland, J.W.2    Sivananthan, S.3
  • 7
    • 33144481819 scopus 로고    scopus 로고
    • note
    • Much smaller than the wavelength of the probing light.
  • 8
    • 35949035159 scopus 로고
    • Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
    • D. A. Aspnes, J. B. Theeten, and F. Hottier, "Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry" Phys. Rev. B, 20 (1979) 3292-3302.
    • (1979) Phys. Rev. B , vol.20 , pp. 3292-3302
    • Aspnes, D.A.1    Theeten, J.B.2    Hottier, F.3
  • 9
    • 0001642363 scopus 로고    scopus 로고
    • Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films
    • H. Fujiwara, Joohyun Koh, P. I. Rovira, and R. W. Collins, "Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films" Phys. Rev. B, 61 (2000) 10832-10844.
    • (2000) Phys. Rev. B , vol.61 , pp. 10832-10844
    • Fujiwara, H.1    Koh, J.2    Rovira, P.I.3    Collins, R.W.4
  • 10
    • 84975625012 scopus 로고
    • Ellipsometric view on reflection and scattering from optical blacks
    • S. F. Nee, "Ellipsometric view on reflection and scattering from optical blacks" Appl. Opt. 31, (1992)1549-1556.
    • (1992) Appl. Opt. , vol.31 , pp. 1549-1556
    • Nee, S.F.1
  • 11
    • 0000173368 scopus 로고    scopus 로고
    • Polarization of specular reflection and near-specular scattering by a rough surface
    • S. M. F. Nee, "Polarization of specular reflection and near-specular scattering by a rough surface" Applied Optics 35, 3570-82 (1996).
    • (1996) Applied Optics , vol.35 , pp. 3570-3582
    • Nee, S.M.F.1
  • 14
    • 0036638128 scopus 로고    scopus 로고
    • Control of very-long-wavelength infrared HgCdTe detector-cutoff wavelength
    • D. Phillips, D. D. Edwall, D. L. Lee, "Control of very-long-wavelength infrared HgCdTe detector-cutoff wavelength" J. Electron. Mat. 31 (2002) 664-668.
    • (2002) J. Electron. Mat. , vol.31 , pp. 664-668
    • Phillips, D.1    Edwall, D.D.2    Lee, D.L.3
  • 15
    • 0036638129 scopus 로고    scopus 로고
    • Development and fabrication of two-color mid- And short-wavelength infrared simultaneous unipolar multispectral integrated technology focal-plane arrays
    • L. A. Almeida, M. Thomas, W. Larsen, K. Spariosu, D. D. Edwall, J. D. Benson, W. Mason, A. J. Stolt, and J. H. Dinan, "Development and fabrication of two-color mid- and short-wavelength infrared simultaneous unipolar multispectral integrated technology focal-plane arrays" J. Electron. Mat. 31 (2002) 669-676.
    • (2002) J. Electron. Mat. , vol.31 , pp. 669-676
    • Almeida, L.A.1    Thomas, M.2    Larsen, W.3    Spariosu, K.4    Edwall, D.D.5    Benson, J.D.6    Mason, W.7    Stolt, A.J.8    Dinan, J.H.9
  • 16
    • 0036638728 scopus 로고    scopus 로고
    • HgCdTe composition determination using spectroscopic ellipsometry during molecular beam epitaxy growth of near-infrared avalanche photodiode device structures
    • T. J. De-Lyon, G. L. Olson, J. A. Roth, J.E. Jensen, A. T. Hunter, M. D. Jack, and S. L. Bailey, "HgCdTe composition determination using spectroscopic ellipsometry during molecular beam epitaxy growth of near-infrared avalanche photodiode device structures" J. Electron. Mat. 31 (2002) 688-693.
    • (2002) J. Electron. Mat. , vol.31 , pp. 688-693
    • De-Lyon, T.J.1    Olson, G.L.2    Roth, J.A.3    Jensen, J.E.4    Hunter, A.T.5    Jack, M.D.6    Bailey, S.L.7
  • 17
    • 0035535365 scopus 로고    scopus 로고
    • Growth of HgCdTe for long-wavelength infrared detectors using automated control from spectroscopic ellipsometry measurements
    • J. Phillips, D. Edwall, D. Lee, and J. Arias, "Growth of HgCdTe for long-wavelength infrared detectors using automated control from spectroscopic ellipsometry measurements" J. Vac. Sci. Technol. B 19 (2001) 1580-1584.
    • (2001) J. Vac. Sci. Technol. B , vol.19 , pp. 1580-1584
    • Phillips, J.1    Edwall, D.2    Lee, D.3    Arias, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.