Accuracy of the in situ determination of the CdZnTe temperature by ellipsometry before the growth of HgCdTe by MBE

Journal of Crystal Growth

Volumn 251, Issue 1-4, 2003, Pages 571-575

  Badano, Giacomo ^a   Garland, James W ^a   Sivananthan, S ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

A1. Ellipsometry; A1. Temperature control; A3. Molecular beam epitaxy; B1. HgCdTe

Indexed keywords

BIREFRINGENCE; CHEMISORPTION; ELLIPSOMETRY; MOLECULAR BEAM EPITAXY; SUBSTRATES; TEMPERATURE MEASUREMENT;

OPTICAL CONSTANTS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0037382872     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02430-2     Document Type: Conference Paper

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