Control of very-long-wavelength infrared HgCdTe detector-cutoff wavelength

Journal of Electronic Materials

Volumn 31, Issue 7, 2002, Pages 664-668

  Phillips, J D ^a,b   Edwall, D D ^a   Lee, D L ^a  

^a ROCKWELL SCIENTIFIC COMPANY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Cutoff wavelength; HgCdTe; Infrared detector; Molecular beam epitaxy; Spectroscopic ellipsometry

Indexed keywords

ABSORPTION; COMPOSITION; ELLIPSOMETRY; ENERGY GAP; MERCURY COMPOUNDS; MOLECULAR BEAM EPITAXY; SPECTROSCOPIC ANALYSIS;

SPECTROSCOPIC ELLIPSOMETRY;

INFRARED DETECTORS;

EID: 0036638128     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-002-0216-2     Document Type: Article

References (17)