Nanoscale covalent self-assembly approach to enhancing anode/hole-transport layer interfacial stability and charge injection efficiency in organic light-emitting diodes

Langmuir

Volumn 17, Issue 7, 2001, Pages 2051-2054

  Cui, Ji ^a   Huang, Qinglan ^a   Wang, Qingwu ^a   Marks, Tobin J ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEWETTING;

ELECTRIC POTENTIAL; ELECTRODES; HYDROXYLATION; SELF ASSEMBLY; SOLUTIONS; THERMODYNAMIC STABILITY;

LIGHT EMITTING DIODES;

EID: 0035799442     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la010158c     Document Type: Article

References (27)

1. Tang, C.W.; Slyke, S.A.V. Appl. Phys. Lett. 1987, 51, 913.
2. Malinsky, J.E.; Jabbour, G.E.; Shaheen, S.E.; Anderson, J.D.; Richter, A.G.; Armstrong, N.R.; Kipplelen, B.; Dutta, P.; Peyghambarian, N.; Marks, T.J. Adv. Mater. 1999, 11, 227.
3. Bliznyuk, V.; Ruhstaller, B.; Brock, P.J.; Scherf, U.; Carter, S.A. Adv. Mater. 1999, 11, 1257.
4. Forsythe, E.W.; Abkowitz, M.A.; Gao, Y. J. Phys. Chem. B 2000, 104, 3948.
5. Ho, P.K.H.; Granstrom, M.; Friend, R.H.; Greenham, N.C. Adv. Mater. 1998, 10, 769.
6. Ho, P.K.H.; Kim, J.-S.; Burroughes, J.H.; Becker, H.; Li, S.F.Y.; Brown, T.M.; Cacialli, F.; Friend, R.H. Nature 2000, 404, 481.
7. Lee, S.T.; Wang, Y.M.; Hou, X.Y.; Tang, C.W. Appl. Phys. Lett. 1998, 74, 670.
8. Jabbour, G.E.; Kawabe, Y.; Shaheen, S.E.; Wang, J.F.; Morrell, M.M.; B. Kippelen; Peyghambarian, N. Appl. Phys. Lett. 1997, 71, 1762.
9. Mori, T.; Fujikawa, H.; Tokito, S.; Taga, Y. Appl. Phys. Lett. 1998, 73, 2763.
10. Appleyard, S.F.J.; Day, S.R.; Pickford, R.D.; Willis, M.R. J. Mater. Chem. 2000, 10, 169.
11. (a) Zuppiroli, L.; Si-Ahmed, L.; Kamars, K.; Nüesch, F.; Bussac, M.N.; Ades, D.; Siove, A.; Moons, E.; Grätzel, M. Eur. Phys. J. B 1999, 11, 505.
12. (b) Sheats, J.R.; Antoniadis, H.; Hueschen, M.; Leonard, W.; Miller, J.; Moon, R.; Roitman, D.; Stocking, A. Science 1996, 273, 884.
13. g, thus eroding hole injection efficiency and producing "dark spots": (a) Smith, P.F.; Gerroir, P.; Xie, S.; Hor, A.M.; Popovic, Z.; Hair, M.L. Langmuir 1998, 14, 5946. (b) Fenter, P.; Schreiber, F.; Bulovic, V.; Forrest, S.R. Chem. Phys. Lett. 1997, 277, 521. (c) Zhou, X.; He, Jun.; Liao, L.S.; Lu, M.; Ding, X.M.; Hou, X.Y.; Zhang, X.M.; He, X.Q.; Lee, S.T. Adv. Mater. 2000, 12, 265.
14. g, thus eroding hole injection efficiency and producing "dark spots": (a) Smith, P.F.; Gerroir, P.; Xie, S.; Hor, A.M.; Popovic, Z.; Hair, M.L. Langmuir 1998, 14, 5946. (b) Fenter, P.; Schreiber, F.; Bulovic, V.; Forrest, S.R. Chem. Phys. Lett. 1997, 277, 521. (c) Zhou, X.; He, Jun.; Liao, L.S.; Lu, M.; Ding, X.M.; Hou, X.Y.; Zhang, X.M.; He, X.Q.; Lee, S.T. Adv. Mater. 2000, 12, 265.
15. g, thus eroding hole injection efficiency and producing "dark spots": (a) Smith, P.F.; Gerroir, P.; Xie, S.; Hor, A.M.; Popovic, Z.; Hair, M.L. Langmuir 1998, 14, 5946. (b) Fenter, P.; Schreiber, F.; Bulovic, V.; Forrest, S.R. Chem. Phys. Lett. 1997, 277, 521. (c) Zhou, X.; He, Jun.; Liao, L.S.; Lu, M.; Ding, X.M.; Hou, X.Y.; Zhang, X.M.; He, X.Q.; Lee, S.T. Adv. Mater. 2000, 12, 265.
16. Aziz, H.; Popovic, Z.D.; Nx, N.H.; Hor, A.; Xu, G. Science 1999, 283, 1900.
17. Silane-functionalized HTL, ETL and emissive layer (EML) precursors have previously been used to form robust, mechanically adherent, OLED bulk layers: (a) Li, W.; Wang, Q.; Cui, J.; Chou, H.; Marks, T.J.; Jabbour, G.E.; Shaheen, S.E.; Kippelen, B.; Pegyhambarian, N.; Dutta, P.; Richter, A.J.; Anderson, J.; Lee, P.; Armstrong, N. Adv. Mater. 1999, 11, 730. (b) Li, W.; Malinsky, J.E.; Chou, H.; Ma, W.; Geng, L.; Marks, T.J.; Jannour, G.E.; Shabeen, S.E.; Kippelen, B.; Peyghambarian, N.; Anderson, J.; Lee, P.; Armstrong, N. Mater. Res. Soc. Symp. Proc. 1998, 488, 385. (c) Some aspects of this work were previously communicated: Cui, J.; Wang, Q.; Marks, T.J. Polym. Mater. Sci. Eng. 2000, 83, 239.
18. Silane-functionalized HTL, ETL and emissive layer (EML) precursors have previously been used to form robust, mechanically adherent, OLED bulk layers: (a) Li, W.; Wang, Q.; Cui, J.; Chou, H.; Marks, T.J.; Jabbour, G.E.; Shaheen, S.E.; Kippelen, B.; Pegyhambarian, N.; Dutta, P.; Richter, A.J.; Anderson, J.; Lee, P.; Armstrong, N. Adv. Mater. 1999, 11, 730. (b) Li, W.; Malinsky, J.E.; Chou, H.; Ma, W.; Geng, L.; Marks, T.J.; Jannour, G.E.; Shabeen, S.E.; Kippelen, B.; Peyghambarian, N.; Anderson, J.; Lee, P.; Armstrong, N. Mater. Res. Soc. Symp. Proc. 1998, 488, 385. (c) Some aspects of this work were previously communicated: Cui, J.; Wang, Q.; Marks, T.J. Polym. Mater. Sci. Eng. 2000, 83, 239.
19. Silane-functionalized HTL, ETL and emissive layer (EML) precursors have previously been used to form robust, mechanically adherent, OLED bulk layers: (a) Li, W.; Wang, Q.; Cui, J.; Chou, H.; Marks, T.J.; Jabbour, G.E.; Shaheen, S.E.; Kippelen, B.; Pegyhambarian, N.; Dutta, P.; Richter, A.J.; Anderson, J.; Lee, P.; Armstrong, N. Adv. Mater. 1999, 11, 730. (b) Li, W.; Malinsky, J.E.; Chou, H.; Ma, W.; Geng, L.; Marks, T.J.; Jannour, G.E.; Shabeen, S.E.; Kippelen, B.; Peyghambarian, N.; Anderson, J.; Lee, P.; Armstrong, N. Mater. Res. Soc. Symp. Proc. 1998, 488, 385. (c) Some aspects of this work were previously communicated: Cui, J.; Wang, Q.; Marks, T.J. Polym. Mater. Sci. Eng. 2000, 83, 239.
20. See also: Morais, T.D. d.; F, F.C.; Lahlil, K.; Boilot, J.P. Adv. Mater. 1999, 11, 107.
21. O'Brien, D.F.; Burrows, P.E.; Forrest, S.R.; Koene, B.E.; Loy, E.; Thompson, M.E. Adv. Mater. 1998, 10, 1108.
22. See also: Yase, K.; Yoshida, Y.; Sumimoto, S.; Tangaki, N.; Matsuda, H.; Kato, M. Thin Solid Films 1996, 273, 218.
23. De Gennes, P.G. Rev. Mod. Phys. 1985, 57, 827.
24. Goncalves-Conto, S.; Carrard, M.; Si-Ahmed, L.; Zuppiroli, L. Adv. Mater. 1999, 11, 112.
25. Jabbour, G.E.; Shaheen, S.E.; Kawabe, Y.; Morrell M.M.; Cho, S.; Wang, J.; Kippelen, B.; Peyghambarian, N. SPIE 1997, 3148, 2.
26. Crone, B.K.; Campell, I.H.; Davids, P.S.; Smith, D.L.; Neef, C.J.; Ferraris, J.P. J. Appl. Phys. 1999, 86, 5767.
27. 14a.