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Volumn 151, Issue 7, 2004, Pages
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Kinetics of Ni-mediated crystallization of a-Si through a SiNx cap layer
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
CRYSTALLIZATION;
GRAIN SIZE AND SHAPE;
HEAT TREATMENT;
MASS SPECTROMETRY;
NICKEL;
OPTICAL MICROSCOPY;
PASSIVATION;
REACTION KINETICS;
SPUTTERING;
CAP LAYERS;
METAL DIFFUSION;
SYSTEM-ON-PANEL (SOP);
SILICON NITRIDE;
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EID: 3242723453
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1752936 Document Type: Article |
Times cited : (24)
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References (14)
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