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Volumn 151, Issue 7, 2004, Pages

Kinetics of Ni-mediated crystallization of a-Si through a SiNx cap layer

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ANNEALING; CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; GRAIN SIZE AND SHAPE; HEAT TREATMENT; MASS SPECTROMETRY; NICKEL; OPTICAL MICROSCOPY; PASSIVATION; REACTION KINETICS; SPUTTERING;

EID: 3242723453     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1752936     Document Type: Article
Times cited : (24)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.