Electronic structure of (Pb,La)(Zr,Ti)O3 thin film probed by soft-X-ray spectroscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 9 B, 2005, Pages 6923-6926

  Higuchi, Tohru ^a   Tsukamoto, Takeyo ^a   Hattori, Takeshi ^a   Honda, Yoshihisa ^b   Yokoyama, Shintaro ^b   Funakubo, Hiroshi ^b  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electronic structure; Hybridization effect; PLZT; PZT; Soft X ray emission spectroscopy (SXES); Thin film; X ray absorption spectroscopy (XAS)

Indexed keywords

ELECTRONIC STRUCTURE; THIN FILMS; X RAY SPECTROSCOPY;

BOND LENGTH; HYBRIDIZATION EFFECT; SOFT-X RAY EMISSION SPECTROSCOPY (SXES);

LEAD COMPOUNDS;

EID: 31844454567     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.6923     Document Type: Article

References (29)

1. J. Scott and C. Paz de Araujo: Science 246 (1989) 1400.
2. N. Setter: Piezoelectric Materials in Devices, ed. N. Setter (EPFL Swiss Federal Institute of Technology, Switzerland, 2002) p. 1.
3. K. Nagashima and H. Funakubo: Jpn. J. Appl. Phys. 39 (2000) 212.
4. S. Yokoyama, Y. Honda, H. Morioka, G. Asano, T. Oikawa, T. Iijima, H. Matsuda and H. Funakubo: Jpn. J. Appl. Phys. 42 (2003) 5922.
5. S. Okamoto, S. Yokoyama, Y. Honda, G. Asano and H. Funakubo: Jpn. J. Appl. Phys. 43 (2004) 6567.
6. G. Asano, T. Oikawa and H. Funakubo: Jpn. J. Appl. Phys. 42 (2003) 2801.
7. Y. Honda, S. Yokoyama and H. Funakubo: Trans. Mater. Res. Soc. Jpn. 28 (2003) 157.
8. M. Miyake, K. Lee, S. Kawasaki, Y. Ueda, S. Okamura and T. Shiosaki: Jpn. J. Appl. Phys. 41 (2002) 241.
9. M. Shimizu, M. Okaniwa, H. Fujisawa and H. Niu: Jpn. J. Appl. Phys. 41 (2002) 6686.
10. S. Okamura, R. Takeuchi and T. Shiosaki: Jpn. J. Appl. Phys. 41 (2002) 6714.
11. Z. Wei, K. Yamashita and M. Okuyama: Jpn. J. Appl. Phys. 40 (2001) 5539.
12. H. Xu, T. Kiyomoto, Y. Morikawa, M. Okuyama and C. Lin: Jpn. J. Appl. Phys. 37 (1998) L809.
13. T. Kijima and H. Ishiwara: Jpn. J. Appl. Phys. 41 (2002) L716.
14. M. Kurita, S. Okamura and T. Shiosaki: Jpn. J. Appl. Phys. 43 (2004) 4124.
15. R. E. Cohen: Nature 358 (1992) 136.
16. R. E. Cohen and H. Krakauer: Phys. Rev. B 42 (1990) 6416.
17. S.-H. Wei and H. Krakauer: Phys. Rev. Lett. 55 (1985) 1200.
18. A. Kotani and S. Shin: Rev. Mod. Phys. 73 (2001) 203.
19. T. Higuchi, T. Tsukamoto, M. Watanabe, M. M. Grush, T. A. Callcott, R. C. Perera, D. L. Ederer, Y. Tokura, Y. Harada, Y. Tezuka and S. Shin: Phys. Rev. B 60 (1999) 7711.
20. T. Higuchi, K. Kudoh, T. Takeuchi, Y. Masuda, Y. Harada, S. Shin and T. Tsukamoto: Jpn. J. Appl. Phys. 41 (2002) 7195.
21. J. C. Fuggle and J. E. Inglesfield: Unoccupied Electronic States (Springer-Verlag, Berlin; Tokyo, 1991).
22. T. Higuchi, T. Tsukamoto, K. Kobayashi, Y. Ishiwata, M. Fujisawa, T. Yokoya, S. Yamaguchi and S. Shin: Phys. Rev. B 61 (2000) 12860.
23. T. Higuchi, T. Tsukamoto, K. Kobayashi, S. Yamaguchi, Y. Ishiwata, N. Sata, K. Hiramoto, M. Ishigame and S. Shin: Phys. Rev. B 65 (2002) 33201.
24. K. H. Hardtl and H. Rau: Solid State Commun. 7 (1969) 41.
25. T. Higuchi et al.: in preparation.
26. J. Robertson, W. L. Warren and B. A. Tuttle: J. Appl. Phys. 77 (1995) 3975.
27. T. Higuchi, T. Tsukamoto, K. Oka, T. Yokoya, Y. Tezuka and S. Shin: Jpn. J. Appl. Phys. 38 (1999) 5667.
28. T. Higuchi, T. Tsukamoto, N. Sata, M. Ishigame, Y. Tezuka and S. Shin: Phys. Rev. B 57 (1998) 6978.
29. T. Higuchi, Y. Moriuchi, Y. Noguchi, M. Miyayama, S. Shin and T. Tsukamoto: Jpn. J. Appl. Phys. 42 (2003) 6226.