A second optic head for the Elettra long trace profiler

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5921, Issue , 2005, Pages 1-10

  Cocco, Daniele ^a   Bianco, Anna ^a   Sostero, Giovanni ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ERROR ANALYSIS; MATHEMATICAL MODELS; OPTICAL DEVICES; OPTICAL VARIABLES MEASUREMENT; ULTRAVIOLET RADIATION;

LONG TRACE PROFILER; OPTIC HEAD (OH);

X RAY OPTICS;

EID: 31844431840     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.618322     Document Type: Conference Paper

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