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1
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79952535634
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Design of a long trace surface profile
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P.Z. Takacs, S.N.Qian, J. Colbert, Design of a long trace surface profile, Proceedings SPIE 749, 59-64, 1987
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Takacs, P.Z.1
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31844449168
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http://www.synchrotron-soleil.fr/anglais/science-and-users/optics/cost/
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3
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0038640590
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The present state of Kirkpatrick-Baez mirror systems at the ESRF
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Yves Dabin, Gérard Rostaing, Olivier Hignette, Amparo Rommeveaux, Andreas Freund, The present state of Kirkpatrick-Baez mirror systems at the ESRF, Proceedings SPIE, 2002, Volume 4789, pp. 235-245
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Dabin, Y.1
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Rommeveaux, A.4
Freund, A.5
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4
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31844433838
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Mirror metrology and bender characterization at ESRF
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Amparo Rommeveaux, Olivier Hignette, Christian Morawe, Mirror metrology and bender characterization at ESRF, SPIE's Proc. this conference
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SPIE's Proc.
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Rommeveaux, A.1
Hignette, O.2
Morawe, C.3
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5
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20644452021
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Efficient sub 100 nm focusing of hard X rays
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Olivier Hignette, Peter Cloetens, Gérard Rostaing, Efficient sub 100 nm focusing of hard X rays, Rev. Sci. Inst. 76, 063709, 2005
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Status of the optical metrology at the ESRF
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Olivier Hignette, Amparo Rommeveaux, Status of the optical metrology at the ESRF, Proceedings SPIE, 1996, Volume 2856, pp. 314-322
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Hignette, O.1
Rommeveaux, A.2
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31844440971
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New results in metrology with LTP at SOLEIL synchrotron
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Muriel Thomasset, Sylvain Brochet, François Polack, New results in metrology with LTP at SOLEIL synchrotron, SPIE's Proc. this conference
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Thomasset, M.1
Brochet, S.2
Polack, F.3
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8
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31844436193
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The optical metrology laboratory of sinchrotrone Trieste
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S.N.Qian, G. Sostero, W.Jark, The optical metrology laboratory of sinchrotrone Trieste, Synchrotron Radiation News, 8, No.6,7-9, 1995
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Synchrotron Radiation News
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Qian, S.N.1
Sostero, G.2
Jark, W.3
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9
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0000637816
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The penta-prism LTP: A long-trace-profile with stationary optical head and moving penta-prism
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S.N.Qian, W.Jark, P.Z. Takacs, The penta-prism LTP: A long-trace-profile with stationary optical head and moving penta-prism, Rev. Sci. Instrum., 66 (3),2562-2569, 1995
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Qian, S.N.1
Jark, W.2
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10
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77950850815
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The nanometer optical component measuring machine: A new Sub-nm topography measuring device for X-rax optics at BESSY
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Mellville, New York
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Frank Siewert, Tino Noll, Thomas Schlegel, Thomas Zeschke and Heiner Lammert, The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-rax Optics at BESSY, Mellville, New York, 2004, AIP Conference Proceedings, Volume 705, p. 847-850
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Noll, T.2
Schlegel, T.3
Zeschke, T.4
Lammert, H.5
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11
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1842556549
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Finishing procedure for high performance synchrotron optics
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San Diego, Ca
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th Annual Meeting, San Diego, Ca, 2003
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(2003)
th Annual Meeting
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Schindler, A.1
Haensel, T.2
Nickel, A.3
Thomas, H.J.4
Lammert, H.5
Siewert, F.6
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12
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31844434266
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Advanced metrology, an essential support for the surface finishing of high performance x-ray optics
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this conference
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Frank Siewert, Heiner Lammert, Tino Noll, Thomas Schlegel, Thomas Zeschke, Thomas Hansel, Andreas Nickel, Axel Schindler, Bernd Grubert, Carsten Schlewitt, Advanced metrology, an essential support for the surface finishing of high performance x-ray optics, SPIE's Proc. this conference
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SPIE's Proc.
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Siewert, F.1
Lammert, H.2
Noll, T.3
Schlegel, T.4
Zeschke, T.5
Hansel, T.6
Nickel, A.7
Schindler, A.8
Grubert, B.9
Schlewitt, C.10
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13
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0033888254
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Precision calibration and systematic error reduction in the long trace profiler
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S.N.Qian, G. Sostero, P.Z. Takacs, Precision calibration and systematic error reduction in the long trace profiler, Opt. Eng. 39(1) n 304-310, 2000
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Opt. Eng.
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Qian, S.N.1
Sostero, G.2
Takacs, P.Z.3
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14
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Use and traceable calibration of autocollimators for ultra-precise measurement of slope and topography
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R.Geckeler, I. Weingärtner, A. Just, R. Probst, Use and traceable calibration of autocollimators for ultra-precise measurement of slope and topography. Proceedings SPIE, Volume 4401, 184, 2001
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Geckeler, R.1
Weingärtner, I.2
Just, A.3
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15
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0005336072
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Angle calibration of the long trace profiler using a diffraction grating
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LSBL-160, 26 August
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Steve Irick, Angle calibration of the long trace profiler using a diffraction grating, LBNL ALS Beamline Note, LSBL-160, 26 August, 1992
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(1992)
LBNL ALS Beamline Note
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Irick, S.1
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16
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31844456544
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The APS/ESRF/SPRING-8 metrology round-robin campaign
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this conference
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L. Assoufid, A. Rommeveaux, H. Ohashi, K. Yamauchi, H. Mimura, J. Qian, O. Hignette, T. Ishikawa, C. Morawe, A.T. Macrander, S. Goto, The APS/ESRF/SPRING-8 metrology round-robin campaign, SPIE's Proc. this conference
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SPIE's Proc.
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Assoufid, L.1
Rommeveaux, A.2
Ohashi, H.3
Yamauchi, K.4
Mimura, H.5
Qian, J.6
Hignette, O.7
Ishikawa, T.8
Morawe, C.9
Macrander, A.T.10
Goto, S.11
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