Direct imaging of charge redistribution in a thin SiO2 layer

Europhysics Letters

Volumn 67, Issue 2, 2004, Pages 261-266

  Mang, K M ^a   Kuk, Y ^b   Kwon, J ^c   Kim, Y S ^d   Jeon, D ^b   Kang, C J ^d  

^a SAMSUNG Electronics   (South Korea)

^b Seoul National University   (South Korea)

^c PSIA Corporation   (South Korea)

^d Myong Ji University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3142735977     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2003-10288-6     Document Type: Article

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