![]() |
Volumn 22, Issue 3, 2004, Pages 477-481
|
Ionized magnetron sputter deposition of hard nanocomposite TiN/amorphous-silicon nitride films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTALLOGRAPHY;
DISLOCATIONS (CRYSTALS);
ELASTIC MODULI;
FILM GROWTH;
GRAIN SIZE AND SHAPE;
HARDNESS;
MAGNETRON SPUTTERING;
NANOSTRUCTURED MATERIALS;
PHYSICAL VAPOR DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PLASMAS;
SPUTTER DEPOSITION;
STOICHIOMETRY;
TITANIUM ALLOYS;
CHEMICAL STABILITY;
ION FLUXES;
NANOINDENTATION;
OPERATIONAL PARAMETERS;
THIN FILMS;
|
EID: 3142518030
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1690778 Document Type: Article |
Times cited : (13)
|
References (20)
|