Extended x-ray emission fine structure (exefs) and x-ray absorption near edge structure (xanes) of soil samples

Journal of Trace and Microprobe Techniques

Volumn 19, Issue 4, 2001, Pages 497-507

  Kawai, Jun ^a   Tohno, Susuniu ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Aerosols; Chemical state of silicon; EXEFS; Synchrotron radiation; X ray absorption; X ray spectrometry; XANES

Indexed keywords

EID: 31244436343     PISSN: 07334680     EISSN: None     Source Type: Journal    
DOI: 10.1081/TMA-100107585     Document Type: Article

References (20)

1. Kawai, J.; Adachi, H.; Hayakawa, S.; Zhen, S.Y.; Kobayashi, K.; Gohshi, Y.; Maeda, K.; Kitajima, Y. Depth Selective X-ray Absorption Fine Structure Spectroscopy. Spectrochim. Acta 1994, 49B, 739-743.
2. Kawai, J.; Hayakawa, S.; Zheng, S.; Kitajima, Y.; Adachi, H.; Gohshi, Y.; Esaka, F.; Furuya, K. Depth-Selective Chemical State Analysis of Fly Ash with Simultaneous XANES Measurement of Total Electron and X-ray Fluorescence Yields. Physica 1995, B208 & 209, 237-238.
3. Kawai, J.; Hayakawa, S.; Esaka, F.; Zheg, S.; Kitajima, Y.; Maeda, K.; Adachi, H.; Gohshi, Y.; Furuya, K. Depth-Selective Chemical State Analysis of Fine Particles using X-Ray Absorption. Anal. Chem. 1995, 24, 1526-1529.
4. Tohno, S.; Kawai, J.; Chatani, S.; Ohta, M.; Kitajima, Y.; Yamamoto, K.; Kitamura, Y.; Kasahara, M. Application of X-ray Absorption Fine Structure (XAFS) Spectrometry to Identify the Chemical States of Atmospheric Aerosols. J. Aerosol Sci. 1998, 29, Suppl-1, S235-S236.
5. Kawai, J.; Nakajima, T.; Inoue, T.; Adachi, H.; Yamaguchi, M.; Maeda, M.; Yabuki, S. Chemical Effects on the Intensity of Ti Krç (Radiative Auger Satellite) X-ray Fluorescence Spectra. Analyst (London) 1994, 779, 601-603.
6. Kawai, J.; Hayashi, K.; Awakura, Y. Extended X-ray Absorption Fine Structure (EXAFS) in X-ray Fluorescence Spectra. J. Phys. Soc. Jpn. 1997, 66, 3337-3340.
7. Hayashi, K.; Kawai, J.; Awakura, Y. Extended Fine Structure in Characteristic X-ray Fluorescence: A Novel Structural Analysis Method of Condensed Systems. Spectrochim. Acta 1997, B52, 2169-2172.
8. Tanuma, S.; Nishio, M. AI K-Edge Extended Fine Structures in X-ray Emission Spectra of Aluminum Metal and Aluminum Oxide Measured by an Electron Probe Microanalyzcr (EPMA). Spectrochim. Acta 1998, B53, 505-507.
9. Kawai, J.; Hayashi, K.; Tanuma, S. Extended X-ray Emission Fine Structure of Sodium. Analyst (London) 1998, 725, 617-619.
10. Kawai, J. A Survey of Novel X-ray Analysis Methods. J. Anal. Atom. Spectrom. 1999, ' 14, 455-459.
11. Kawai, J.; Hayashi, K. Extended X-ray Emission Fine Structure (EXEFS). J. Electron Spectrosc. Relat. Phenom. 1998, 92, 243-245.
12. Kawai, J.; Hayashi, K.; Okuda, K.; Nisawa, A. Si X-ray Absorption Near Edge Structure (XANES) in X-Ray Fluorescence Spectra. Chem. Lett. 1998, 245-246.
13. Kawai, J.; Hayashi, K.; Okuda, K.; Nisawa, A. X-ray Absorption Spectroscopy Using X-ray Fluorescence Spectrometer. RIGAKU Journal 1998, 75(2), 33-37.
14. Kawai, J.; Takahashi, H. Si X-ray Absorption Near Edge Structure (XANES) of Si, SiC, SiO2, and Si3N4 Measured by an Electron Probe X-ray Microanalyzer (EPMA). Spectrochim. Acta 1999, B54, 231-234.
15. Kawai, J.; Takahashi, H.; Shimizu, R. High Spatial Resolution X-ray Absorption Near Edge Structure (XANES) of Si Compounds Measured by an Electron Probe X-ray Microanalyser (EPMA). J. Trace Microprobe Techn. 1999, 77, 39-47.
16. Kawai, J.; Hayashi, K.; Takahashi, H.; Kitajima, Y. Micro-XANES by EPMA Spectrometer. J. Synchrotron Rad. 1999, 6, 356-368.
17. Fujikawa, T.; Kawai, J. Theory of Extended X-ray Emission Spectra. J. Phys. Soc. Jpn. 1999, 68, 4032-4036.
18. 2) Polymorphs: The Structural Characterization of Opal. Am. Mineral. 1994, 79, 622-632.
19. Li, D.; Bancroft, G.M.; Fleet, M.E.; Feng, X.H. Silicon K-Edge XANES Spectra of Silicate Minerals. Phys. Chem. Minerals 1995, 22, 115-122.
20. Ildefonse, Ph.; Calas, G.; Flank, A.M.; Lagarde, P. Low Z Elements (Mg, AI, and Si) K-Edge X-ray Absorption Spectroscopy in Minerals and Disordered Systems. Nucl. Instrum. Methods Phys. Res. 1995, B97, 172-175.