Extended fine structure in characteristic X-ray fluorescence: A novel structural analysis method of condensed systems

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 52, Issue 14, 1997, Pages 2169-2172

  Hayashi, Kouichi ^a   Kawai, Jun ^a   Awakura, Yasuhiro ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

EXAFS; Soft X ray; X ray fluorescence (XRF)

Indexed keywords

ALUMINUM; OSCILLATIONS;

AUGER X RAY FLUORESCENCE SPECTROSCOPY; EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; QUANTUM INTERFERENCE EFFECTS;

X RAY SPECTROSCOPY;

EID: 0031357721     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(97)00097-9     Document Type: Article

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