Extended X-ray emission fine structure (EXEFS)

Journal of Electron Spectroscopy and Related Phenomena

Volumn 92, Issue 1-3, 1998, Pages 243-245

  Kawai, J ^a   Hayashi, K ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

AlN; Crystal structure; EXAFS; X ray spectroscopy

Indexed keywords

EID: 0000884286     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(98)00129-7     Document Type: Article

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