Si X-ray absorption near edge structure (XANES) in X-ray fluorescence spectra

Chemistry Letters

Volumn , Issue 3, 1998, Pages 245-246

  Kawai, Jun ^b   Hayashi, Kouichi ^b   Okuda, Kazuaki ^a   Nisawa, Atsushi ^a  

^a Rigaku Industrial Corporation   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032349733     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.1998.245     Document Type: Article

References (9)

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