Micro-XANES by EPMA spectrometer

Journal of Synchrotron Radiation

Volumn 6, Issue 3, 1999, Pages 356-358

  Kawai, Jun ^a   Hayashi, Kouichi ^a   Takahashi, Hideyuki ^b   Kitajima, Yoshinori ^c  

^a KYOTO UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

^c INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

Electron probe X ray microanalyzer; EPMA; EXEFS; Radiative Auger effect; X ray emission spectroscopy

Indexed keywords

EID: 0033437858     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049598017270     Document Type: Article

References (16)

1. Åberg, T. (1971) Phys. Rev. A4, 1735-1740.
2. Hayashi, K., Kawai, J., & Awakura, Y. (1997). Spectrochim. Acta, B52, 2169-2172.
3. Kawai, J., Nakajima, T., Inoue, T., Adachi, H., Yamaguchi, M., Maeda, K., & Yabuki, S. (1994). Analyst, 119, 601-603.
4. Kawai, J., Hayashi, K., & Awakura, Y. (1997). J. Phys. Soc. Jpn. 66, 3337-3340.
5. Kawai, J., Hayashi, K., & and Tanuma S. (1998a) Analyst, 123, 617-619.
6. Kawai, J. & Hayashi, K. (1998b). J. Electron Spectrosc. Relat. Phenom. 92, 243-245.
7. Kawai, J., Hayashi, K., Okuda, K., & Nisawa, A. (1998e). Chem. Lett. 245-246.
8. Kawai, J., Hayashi, K., Okuda, K., & Nisawa A. (1998J) RIGAKU-DENKI Journal, 29 (1), 23-27.
9. Kawai, J., Hayashi, K., Okuda, K., & Nisawa, A. (1998e) RIGAKU Journal, 15 (2), 33-37.
10. Kawai, J., Takahashi, H., & Shimizu, R. (1999a) J. Trace Microprobe Technol. 17 (1). In the press.
11. Kawai, J. & Takahashi, H. (1999b) Spectrochim. Acta, B54 (1). In the press.
12. Kitajima, Y. (1996). Photon Factory News, 14 (2), 8-10.
13. Kitajima, Y. (1997). Photon Factory News, 15(1), 13-14.
14. Kitajima, Y. (1998a). Photon Factory News, 16 (4), 10.
15. Kitajima, Y., Amemiya, K., Yonamoto, Y., Ohta, T., Kikuchi, T., Kosuge, T., Toyoshima, A., & Ito, K. (1998b). J. Synchrotron Rad., 5, 729-731.
16. Tanuma, S., & Nishio, M. (1998). Spectrochim. Acta, B53, 505-507.