Al K-edge extended fine structures in X-ray emission spectra of aluminum metal and aluminum oxide measured by an electron probe microanalyzer (EPMA)

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 53, Issue 3, 1998, Pages 505-507

  Tanuma, S ^a   Nishio, M ^a  

^a Japan Ener Analyt Res Ctr C   (Japan)

Author keywords

Aluminum metal; Aluminum oxide; Electron probe microanalyzer; Extended fine structures; X ray emission spectra

Indexed keywords

ALUMINUM; ALUMINUM COMPOUNDS; EMISSION SPECTROSCOPY; FLUORESCENCE; MICROANALYSIS; OSCILLATIONS;

ALUMINUM OXIDE; ELECTRON PROBE MICROANALYSIS (EPMA); X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; X RAY EMISSION SPECTROSCOPY; X RAY FLUORESCENCE (XRF) SPECTROSCOPY;

X RAY SPECTROSCOPY;

EID: 0032022135     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0584-8547(97)00125-0     Document Type: Article

References (4)

1. J. Kawai, T. Nakajima, T. Inoue, H. Adachi, M. Yamaguchi, K. Maeda, S. Yabuki., Analyst 119 (1994) 601.
2. K. Hayashi, J. Kawai, Y. Awakura, Spectrochim. Acta B, in press.
3. A. Fontain, P. Lagarde, D. Raoux, J.M. Estva., J. Phys. F: Metal Phys. 9 (1978) 2143.
4. J. Kawai, K. Hayashi, Y. Awakura, J. Phys. Soc. Jpn., in press.