Si X-ray absorption near edge structure (XANES) of Si, SiC, SiO2, and Si3N4 measured by an electron probe X-ray microanalyzer (EPMA)

Spectrochimica acta, Part B: Atomic spectroscopy

Volumn 54, Issue 1, 1999, Pages 231-234

  Kawai, Jun ^a   Takahashi, Hideyuki ^b  

^a KYOTO UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; EMISSION SPECTROSCOPY; MICROANALYSIS; SILICA; SILICON; SILICON CARBIDE; SILICON NITRIDE;

ELECTRON PROBE MICROANALYSIS (EPMA); EXTENDED X RAY FINE STRUCTURE (EXAFS) SPECTROSCOPY; X RAY ABSORPTION NEAR EDGE STRUCTURE (XANES) SPECTROSCOPY;

X RAY SPECTROSCOPY;

EID: 0033521430     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(98)00153-0     Document Type: Article

References (21)

1. Bloch F., Ross P.A. Phys. Rev. 47:1935;884.
2. Bloch F. Phys. Rev. 48:1935;187.
3. Hulubei M.H. Compt. Rend. 224:1947;770.
4. Hulubei M.H., Cauchois Y., Manescu I. Compt. Rend. 226:1948;764.
5. Åberg T., Utriainen J. Phys. Rev. Lett. 22:1969;1346.
6. Åberg T. Phys. Rev. A. 4:1971;1735.
7. Åberg T., Utriainen J. J. de Phys. (Paris) Colloq. 32:1971;C4-295.
8. Kawai J., Nakajima T., Inoue T., Adachi H., Yamaguchi M., Maeda K., Yabuki S. Analyst. 119:1994;601.
9. Hayashi K., Kawai J., Awakura Y. Spectrochim. Acta B. 52:1997;2169.
10. Kawai J., Hayashi K., Awakura Y. J. Phys. Soc. Jpn. 66:1997;3337.
11. S. Tanuma, M. Nishio, Spectrochim. Acta B 53 (1998), in press.
12. Kawai J., Hayashi K., Tanuma S. Analyst. 123:1998;617.
13. J. Kawai, K. Hayashi, J. Electron Spectrosc. Relat. Phenom. (1998), 245.
14. J. Kawai, K. Hayashi, K. Okuda, A. Nisawa, Chem. Lett. (1998), in press.
15. S.J.B. Reed, Electron Microprobe Analysis, 2nd ed., Cambridge University Press, Cambridge, 1993.
16. I.M. Watt, The Principles and Practice Of Electron Microscope, 2nd ed., Cambridge University Press, Cambridge, 1997.
17. Savitzky A., Golay M.J.E. Anal. Chem. 36:1964;1627.
18. Wong J., George G.N., Pickering I.J., Rek Z.U., Rowen M., Tanaka T., Via G.H., DeVries B., Vaughan D.E.W., Brown G.E. Jr. Solid State Commun. 92:1994;559.
19. Kitajima Y. Rev. Sci. Instrum. 66:1995;1413.
20. Nagashima N., Nakano A., Ogata K., Tamura M., Sugawara K., Hayakawa K. Phys. Rev. B. 48:1993;18257.
21. T. Ohta, Y. Kitajima, H. Sekiyama, K. Asakura, and H. Kuroda, Photon Factory Activity Report #2, 1983/1984, p. VI-112.