Extended X-ray emission fine structure of sodium

Analyst

Volumn 123, Issue 4, 1998, Pages 617-619

  Kawai, Jun ^a   Hayashi, Kouichi ^a   Tanuma, Shigeo ^b  

^a KYOTO UNIVERSITY   (Japan)

^b Japan Ener Analyt Res Ctr C   (Japan)

Author keywords

Amorphous; Electron probe microanalysis; Extended X ray emission fine structure; Sodium K edge; Structure analysis; Wavelength dispersive X ray fluorescence

Indexed keywords

SODIUM;

ABSORPTION SPECTROSCOPY; CONFERENCE PAPER; ELECTRON PROBE MICROANALYSIS; FOURIER TRANSFORMATION; SYNCHROTRON; X RAY FLUORESCENCE;

EID: 0031977924     PISSN: 00032654     EISSN: None     Source Type: Journal    
DOI: 10.1039/a707794g     Document Type: Conference Paper

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