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Volumn , Issue , 2005, Pages 69-72

GaAsSb DHBT IC technology for RF and microwave instrumentation

Author keywords

DHBT; GaAsSb; Indium phosphide; Instrumentation; Transistor

Indexed keywords

DHBT; GAASSB; INSTRUMENTATION; MICROWAVE INSTRUMENTATION; MTTF;

EID: 30944453326     PISSN: 15508781     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CSICS.2005.1531760     Document Type: Conference Paper
Times cited : (25)

References (18)
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  • 5
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    • Self-aligned InP DHBT with fT and fmax over 300 GHz in a new manufacturable technology
    • G. He, J. Howard, M. Le, P. Partyka. B. Li, G. Kim, et al., "Self-aligned InP DHBT with fT and fmax over 300 GHz in a new manufacturable technology," IEEE Electron Device Lett., vol. 25. no. 8, pp. 520-522, 2004.
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    • Fundamental low phase noise InP-based DHBT VCOs with high output power operating up to 75 GHz
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  • 10
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    • 300 GHz InP/GaAsSb/InP double HBTs with high current capability and BVceo ≥ 6V
    • M.W. Dvorak. C.R. Bolognesi. O.J. Pitts, and S.P. Watkins. "300 GHz InP/GaAsSb/InP double HBTs with high current capability and BVceo ≥ 6V. " IEEE Electron Device Lett., vol. 22. no. 8. pp. 361-363, 2001.
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    • 6444231054 scopus 로고    scopus 로고
    • InP/GaAsSb type-II DHBTs with fT > 350 GHz
    • B.F. Chu-Kung and M. Feng, "InP/GaAsSb type-II DHBTs with fT > 350 GHz," Electron. Lett., vol. 40. no. 20, pp. 1305-1306, 2004.
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    • First demonstration of low-power monolithic transimpedance amplifier using InP/GaAsSb/InP DHBTs
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    • 40 Gbit/s digital IC fabricated using InP/GaAsSb/InP DHBT technology
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    • A frequency agile 40 Gb/s half rate linear phase detector for data jitter measurement
    • to be published
    • R. Karlquist, C. Hutchinson, T. Marshall, and R. Van Tuyl, "A frequency agile 40 Gb/s half rate linear phase detector for data jitter measurement." in Proc. CSICS 2005. to be published.
    • Proc. CSICS 2005
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.