Optical characterization of ferroelectric Bi3.25La 0.75Ti3O12 thin films

European Physical Journal B

Volumn 38, Issue 3, 2004, Pages 431-436

  Hu, Z G ^a   Huang, Z M ^a   Wu, Y N ^a   Hu, S H ^a   Wang, G S ^a   Ma, J H ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATION THEORY; ELECTRIC INSULATORS; LIGHT ABSORPTION; LIGHT TRANSMISSION; REFRACTIVE INDEX; SEMICONDUCTING BISMUTH COMPOUNDS;

INVERSE SYNTHESIS; OPTICAL CONSTANTS; TRANSMITTANCE SPECTRA; TRANSMITTANCE SPECTROSCOPY;

FERROELECTRIC MATERIALS;

EID: 3042651160     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2004-00136-7     Document Type: Article

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36. When this is done, the parameters in Table 1 are changed beyond the indicated errors bars, except for the thicknesses. The largest changes occur for the oscillator strengths