Simultaneous determination of refractive index, extinction coefficient, and void distribution of titanium dioxide thin film by optical methods

Applied Optics

Volumn 35, Issue 34, 1996, Pages 6703-6707

  Kim, S Y ^a  

^a Ajou University   (South Korea)

Author keywords

Extinction coefficient; Refractive index; Spectroscopic ellipsometry; Surface roughness; Thickness determination; Thin film; Titanium dioxide; Transmission; Void distribution

Indexed keywords

EID: 0001289091     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.006703     Document Type: Article

References (14)

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