Structural and optical characterization of Bi4Ti3O12 thin films prepared by metallorganic solution deposition technique

Infrared Physics and Technology

Volumn 40, Issue 1, 1999, Pages 55-60

  Wang, Xu Sheng ^a   Zhai, Ji Wei ^b   Zhang, Liang Ying ^b   Yao, Xi ^b  

^a XIDIAN UNIVERSITY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Bi4Ti3O12 thin films; Metallorganic solution deposition; Structural and optical characterization

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; CRYSTAL MICROSTRUCTURE; DEPOSITION; ENERGY GAP; FERROELECTRIC MATERIALS; LIGHT EXTINCTION; NANOSTRUCTURED MATERIALS; QUARTZ; REFRACTIVE INDEX; THERMAL EFFECTS; THIN FILMS;

BISMUTH TITANATE; EXTINCTION COEFFICIENT; MANIFACIER METHOD; METALLORGANIC SOLUTION DEPOSITION;

DIELECTRIC FILMS;

EID: 0033080231     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4495(98)00048-6     Document Type: Article

References (14)

1. Scott J.F., Araujo C.A. Science. 246:1989;1400.
2. M.H. Francombe, in: M.H. Francombe, J.L. Vossen (Eds.), Physics of Thin Films, Vol. 17, Academic Press, New York, 1993, p. 225.
3. Ousi-Benomar W., Xue S.S., Lessard R.A., Singh A., Wu Z.L., Kuo P.K. J. Mater. Res. 9:1994;970.
4. Chang D.-A., Lin P., Tseng T.-Y. J. Appl. Phys. 77:1995;4445.
5. Peng C.H., Desu S.B. J. Am. Ceram. Soc. 77:1994;929.
6. Bertolotti M., Mura S., Pennella E., Senesi F., Sibilia C., Montenero A., Gnappi G., Pigoni S. J. Non-Cryst. Solids. 187:1995;453.
7. Serra E.R., Charbouillot Y., Baudry P., Aegerter M.A. J. Non-Cryst. Solids. 121:1990;323.
8. Jo W., Cho H.-J., Noh T.W., Cho Y.S., Kwun S.-I. Ferroelectrics. 152:1994;139.
9. Wu S.Y., Takei W.J., Francombe M.H. Ferroelectrics. 10:1976;209.
10. Wu S.Y. IEEE Trans. Electron Devices. ED 21:1974;499.
11. Joshi P.C., Desu S.B. J. Appl. Phys. 80:1996;2349.
12. Manifacier J.C., Gasiot J., Fillard J.P. J. Phys. E: Sci. Instr. 9:1976;1002.
13. Rigaku, Handbook of X-ray Diffraction, third revision, Rigaku, Japan, 1985.
14. Lehan J.P. Appl. Opt. 35:1996;5048.