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Volumn 44, Issue 42-45, 2005, Pages

Nanoscale capacitance-voltage characterization of two-dimensional electron gas in AlGaN/GaN heterostructures

Author keywords

AlGaN GaN heterostructures; Capacitance voltage measurements; Nanoscale; Scanning probe microscopy; Two dimensional electron gas

Indexed keywords

CAPACITANCE MEASUREMENT; GALLIUM NITRIDE; HETEROJUNCTIONS; SEMICONDUCTING ALUMINUM COMPOUNDS; THRESHOLD VOLTAGE; VOLTAGE MEASUREMENT;

CAPACITANCE-VOLTAGE MEASUREMENTS; SCANNING PROBE MICROSCOPY; TWO-DIMENSIONAL ELECTRON GAS (2DEG);

ELECTRON GAS;

EID: 30344441521 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.44.L1348 Document Type: Article

Times cited : (5)

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