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Volumn 21, Issue 12, 2005, Pages 1450-1454

Dislocation patterning during crystal growth of semiconductor compounds (GaAs)

Author keywords

Crystal growth; Dislocations and dislocation theory; GaAs; Modelling and simulation; Point defects; Single crystals

Indexed keywords

COMPUTER SIMULATION; CRYSTAL GROWTH; DEFORMATION; DISLOCATIONS (CRYSTALS); POINT DEFECTS; SHEAR STRESS; SINGLE CRYSTALS; STOICHIOMETRY; VECTORS;

EID: 29444447523     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/174328405X71594     Document Type: Conference Paper
Times cited : (15)

References (28)
  • 16
    • 0013013734 scopus 로고    scopus 로고
    • Leipzig & Stuttgart, Deutscher Verlag für Grundstoffindustrie
    • J. Ohser and U. Lorz: 'Quantitative Gefügeanalyse'; 1996, Leipzig & Stuttgart, Deutscher Verlag für Grundstoffindustrie.
    • (1996) Quantitative Gefügeanalyse
    • Ohser, J.1    Lorz, U.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.