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Volumn 213, Issue 1, 2000, Pages 10-18

Temperature field simulation and correlation to the structural quality of semi-insulating GaAs crystals grown by the vapour pressure controlled Czochralski method (VCz)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; CORRELATION METHODS; CRYSTAL GROWTH FROM MELT; CRYSTAL STRUCTURE; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SEMICONDUCTOR GROWTH; STRESSES; SURFACE STRUCTURE; TEMPERATURE DISTRIBUTION; VAPOR PRESSURE;

EID: 0033742744     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00208-6     Document Type: Article
Times cited : (27)

References (17)
  • 14
    • 85031563883 scopus 로고    scopus 로고
    • http://www.ikz-berlin.de/~kb/daten/mat-1/mat.html
  • 15
    • 85031570993 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Erlangen-Nürnberg
    • M. Kurz, Ph.D. Thesis, University of Erlangen-Nürnberg, 1998.
    • (1998)
    • Kurz, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.