XM-1, the high-resolution soft X-ray microscope at the advanced light source

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4146, Issue 1, 2000, Pages 54-59

  Pearson, Angelic L ^a   Chao, Weilun ^a,b   Denbeaux, Gregory ^a   Eimuller, Thomas ^c   Fischer, Peter ^a,c   Johnson, Lewis ^a   Koehler, Matthias ^c   Larabell, Carolyn ^a   Le Gros, Mark ^a   Yager, Deborah ^a   Attwood, David ^a,b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

Computer processing; Magnetic imaging; Spatial resolution; X MCD; X ray microscope; XM 1

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; IMAGE PROCESSING; LIGHT SOURCES; MONOCHROMATORS; OPTICAL RESOLVING POWER; PHOTONS;

BENDING MAGNET RADIATIONS; FRESNEL CONDENSER ZONE PLATES (CZP); MAGNETIC CIRCULAR DICHROISM;

X RAY MICROSCOPES;

EID: 1642555615     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.406672     Document Type: Article

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