Comparative study of magnetization reversal in isolated and strayfield coupled microcontacts

Applied Physics Letters

Volumn 85, Issue 7, 2004, Pages 1193-1195

  Meier, Guido ^a   Eiselt, René ^a   Bolte, Markus ^a   Barthelmeß, Miriam ^a   Eimüller, Thomas ^b   Fischer, Peter ^b  

^a UNIVERSITY OF HAMBURG   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETIC MICROCONTACTS; MAGNETIC-FORCE MICROSCOPY (MFM); SPIN INJECTION; X-RAY MAGNETIC CIRCULAR DICHROISM (XMCD);

ANISOTROPY; COMPUTER SIMULATION; ELECTRON BEAM LITHOGRAPHY; MAGNETORESISTANCE; PHOTONS; POLYCRYSTALLINE MATERIALS; SILICON NITRIDE; X RAYS;

FERROMAGNETIC MATERIALS;

EID: 4444301425     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1777824     Document Type: Article

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