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Volumn 25, Issue 6, 2004, Pages 424-426

RF power silicon-on-glass VDMOSFETs

Author keywords

Self heating; Silicon RF power MOSFETs; Silicon on glass (SOG); Substrate transfer; Vertical double diffused MOSFETs (VDMOSFET)

Indexed keywords

ELECTRIC BREAKDOWN; GATES (TRANSISTOR); GLASS; HEAT SINKS; HOT CARRIERS; POWER AMPLIFIERS; RELIABILITY; SILICON ON INSULATOR TECHNOLOGY; THERMODYNAMIC STABILITY;

EID: 2942752392     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2004.829025     Document Type: Letter
Times cited : (19)

References (18)
  • 1
    • 0030397063 scopus 로고    scopus 로고
    • High performance silicon LDMOS technology for 2 GHz RF power amplifier applications
    • A. Wood, C. Dragon, and W. Burger, "High performance silicon LDMOS technology for 2 GHz RF power amplifier applications," in IEDM Tech. Dig., 1996, pp. 87-90.
    • IEDM Tech. Dig., 1996 , pp. 87-90
    • Wood, A.1    Dragon, C.2    Burger, W.3
  • 5
    • 0030422321 scopus 로고    scopus 로고
    • High efficiency LDMOS power FET for low voltage wireless communications
    • G. Ma, W. Burger, C. Dragon, and T. Gillenwater, "High efficiency LDMOS power FET for low voltage wireless communications," in IEDM Tech. Dig., 1996, pp. 91-94.
    • IEDM Tech. Dig., 1996 , pp. 91-94
    • Ma, G.1    Burger, W.2    Dragon, C.3    Gillenwater, T.4
  • 6
    • 0035445505 scopus 로고    scopus 로고
    • Theoretical analysis and experimental characterization of the dummy-gated VD-MOSFET
    • Sept.
    • S. Xu, C. Ren, Y. C. Liang, P.-D. Foo, and J. K. O. Sin, "Theoretical analysis and experimental characterization of the dummy-gated VD-MOSFET," IEEE Trans. Electron Devices, vol. 48, pp. 2168-2176, Sept. 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , pp. 2168-2176
    • Xu, S.1    Ren, C.2    Liang, Y.C.3    Foo, P.-D.4    Sin, J.K.O.5
  • 8
    • 0032677452 scopus 로고    scopus 로고
    • Thermal and package performance limitations in LDMOSFET's for RFIC applications
    • May
    • P. Khandelwal, M. Trivedi, K. Shenai, and S. K. Leong, "Thermal and package performance limitations in LDMOSFET's for RFIC applications," IEEE Trans. Microwave Theory Tech., vol. 47, pp. 575-585, May 1999.
    • (1999) IEEE Trans. Microwave Theory Tech. , vol.47 , pp. 575-585
    • Khandelwal, P.1    Trivedi, M.2    Shenai, K.3    Leong, S.K.4
  • 12
    • 0012172569 scopus 로고    scopus 로고
    • Front-to backwafer overlay accuracy in substrate transfer technologies
    • H. W. van Zeijl and J. Slabbekoorn, "Front-to backwafer overlay accuracy in substrate transfer technologies," in Proc. ISTC, 2001, pp. 356-367.
    • Proc. ISTC, 2001 , pp. 356-367
    • Van Zeijl, H.W.1    Slabbekoorn, J.2
  • 15
    • 2942713845 scopus 로고    scopus 로고
    • Experimental verification of the smoothie database model for third- and fifth-order intermodulation distortion
    • V. Cuoco, M. P. van d. Heijden, M. Pelk, and L. C. N. de Vreede, "Experimental verification of the smoothie database model for third- and fifth-order intermodulation distortion," in Proc. ESSDERC, 2002, pp. 635-638.
    • Proc. ESSDERC, 2002 , pp. 635-638
    • Cuoco, V.1    Van D. Heijden, M.P.2    Pelk, M.3    De Vreede, L.C.N.4
  • 18
    • 0003547182 scopus 로고
    • Palo Alto, CA
    • TMA Inc., MEDICI User's Manual, Palo Alto, CA, 1992.
    • (1992) MEDICI User's Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.