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Volumn , Issue , 1996, Pages 87-90
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High performance silicon LDMOS technology for 2GHz RF power amplifier applications
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC DISTORTION;
INTEGRATED CIRCUIT MANUFACTURE;
INTEGRATED CIRCUIT TESTING;
POWER AMPLIFIERS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE STRUCTURES;
EFFICIENCY;
SILICON;
DRAIN OPERATING VOLTAGE;
INTERMODULATION DISTORTION;
POWER GAIN COMPRESSION;
POWER TRANSISTOR;
MOSFET DEVICES;
MOS DEVICES;
DEVICE PERFORMANCE;
DEVICE PROCESSING;
DRAIN EFFICIENCY;
GAIN COMPRESSION;
OPERATING VOLTAGE;
PERFORMANCE;
POWER GAINS;
RF POWER AMPLIFIERS;
RF POWER TRANSISTORS;
TEST CONDITION;
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EID: 0030397063
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (97)
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References (0)
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