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Volumn 19, Issue 6, 2004, Pages 669-672
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Low resistance Ni-Zn solid solution/Pd ohmic contacts to p-type GaN
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ELECTRIC POTENTIAL;
ELECTRIC RESISTANCE;
NICKEL ALLOYS;
OHMIC CONTACTS;
SEMICONDUCTOR QUANTUM WELLS;
SOLID SOLUTIONS;
BUFFERED OXIDE ETCH (BOE);
CIRCULAR TRANSFER LENGTH METHOD (CTLM);
CONTACT RESISTANCE;
DOPANTS;
GALLIUM NITRIDE;
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EID: 2942556704
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/19/6/001 Document Type: Article |
Times cited : (6)
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References (17)
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