Monte-Carlo simulations to quantify neutron-induced Multiple Bit Upsets in advanced SRAMs

IEEE Transactions on Nuclear Science

Volumn 52, Issue 5 II, 2005, Pages 1538-1544

  Mérelle, Thomas ^a,b   Saigne F ^b   Sagnes, B ^b   Gasiot, G ^a   Roche, Ph ^a   Carriere T ^c   Palau, M C ^c   Wrobel, F ^d   Palau, J M ^b,c  

^a STMICROELECTRONICS   (France)

^b UNIV MONTPELLIER   (France)

^c AIRBUS GROUP INNOVATIONS   (Germany)

^d UNIVERSITÉ CÔTE D'AZUR   (France)

Author keywords

Bulk; Diffusion; Monte Carlo; Multiple bit upsets (MBU); Neutron; SEU; SRAM

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; MONTE CARLO METHODS; NEUTRONS;

BULK; MULTIPLE BIT UPSETS (MBU); SEU;

STATIC RANDOM ACCESS STORAGE;

EID: 29144488380     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.855823     Document Type: Conference Paper

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