Monte Carlo exploration of neutron-induced SEU-sensitive volumes in SRAMs

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3075-3081

  Palau, J M ^a   Wrobel, F ^a   Castellani Coulie K ^a   Calvet, M C ^b   Dodd, P E ^c   Sexton, F W ^c  

^a UNIV MONTPELLIER   (France)

^b AIRBUS GROUP INNOVATIONS   (Germany)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Atmospheric neutrons; Device simulation; Ion tracks; Recoils; Sensitive volume; Single event upset (SEU); Soft error rate (SER); SRAM

Indexed keywords

BIT ERROR RATE; COMPUTER SIMULATION; IONS; MONTE CARLO METHODS; NEUTRONS; SORTING; STATISTICAL METHODS;

SOFT ERROR RATE (SER);

STATIC RANDOM ACCESS STORAGE;

EID: 0036947787     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805420     Document Type: Conference Paper

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