Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions

IEEE Transactions on Nuclear Science

Volumn 47, Issue 6 III, 2000, Pages 2580-2585

  Wrobel, F ^a   Palau, J M ^a   Calvet, M C ^b   Bersillon, O ^c   Duarte, H ^c  

^a UNIV MONTPELLIER   (France)

^b AEROSPATIALE   (France)

^c CEA DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; IONIZATION; IONS; MATHEMATICAL MODELS; MONTE CARLO METHODS; SILICON;

NEUTRON REACTIONS; NUCLEAR REACTIONS; SILICON NUCLEI; SOFT ERROR RATES; SPALLATION REACTION EFFECTS;

NEUTRONS;

EID: 0034451209     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903812     Document Type: Conference Paper

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