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Volumn 87, Issue 24, 2005, Pages 1-3
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Deep-ultraviolet micro-Raman investigation of surface defects in a 4H-SiC homoepitaxially grown film
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECTS;
EPITAXIAL GROWTH;
PARAMETER ESTIMATION;
PHONONS;
RAMAN SPECTROSCOPY;
SILICON CARBIDE;
ACOUSTIC PHONONS;
COMET DEFECTS;
OPTICAL PHONONS;
SURFACE DEFECTS;
ULTRAVIOLET RADIATION;
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EID: 28944451206
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2142080 Document Type: Article |
Times cited : (10)
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References (17)
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