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Volumn 87, Issue 24, 2005, Pages 1-3

Deep-ultraviolet micro-Raman investigation of surface defects in a 4H-SiC homoepitaxially grown film

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; EPITAXIAL GROWTH; PARAMETER ESTIMATION; PHONONS; RAMAN SPECTROSCOPY; SILICON CARBIDE;

EID: 28944451206     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2142080     Document Type: Article
Times cited : (10)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.