SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Physical Review Letters

Volumn 95, Issue 17, 2005, Pages

Shot noise suppression in avalanche photodiodes

(3) Ma, Feng a Wang, Shuling a Campbell, Joe C a

a The University of Texas at Austin (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE PHOTODIODES; COULOMB INTERACTION; CURRENT PULSES; SHOT NOISE SUPPRESSION;

HETEROJUNCTIONS; MECHANISMS; MONTE CARLO METHODS; NOISE ABATEMENT; SHOT NOISE;

AVALANCHE DIODES;

EID: 28844463146 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.95.176604 Document Type: Article

Times cited : (8)

References (20)

1
- 0032023357
- PRLTAO. 0031-9007. 10.1103/PhysRevLett.80.2901
- T. González, Phys. Rev. Lett. 80, 2901 (1998). PRLTAO 0031-9007 10.1103/PhysRevLett.80.2901
- (1998) Phys. Rev. Lett. , vol.80 , pp. 2901
- González, T.¹

2
- 6644224009
- PRLTAO 0031-9007 10.1103/PhysRevLett.86.2114
- S. Oberholzer, Phys. Rev. Lett. 86, 2114 (2001). PRLTAO 0031-9007 10.1103/PhysRevLett.86.2114
- (2001) Phys. Rev. Lett. , vol.86 , pp. 2114
- Oberholzer, S.¹

3
- 11944274178
- PRLTAO 0031-9007 10.1103/PhysRevLett.75.3340
- M. Reznikov, M. Heiblum, H. Shtrikman, and D. Mahalu, Phys. Rev. Lett. 75, 3340 (1995). PRLTAO 0031-9007 10.1103/PhysRevLett.75.3340
- (1995) Phys. Rev. Lett. , vol.75 , pp. 3340
- Reznikov, M.¹ Heiblum, M.² Shtrikman, H.³ Mahalu, D.⁴

4
- 0000283621
- PRBMDO 0163-1829 10.1103/PhysRevB.46.9620
- J.H. Davies, P. Hyldgaard, S. Hershfield, and J.W. Wilkins, Phys. Rev. B PRBMDO 0163-1829 46, 9620 (1992). 10.1103/PhysRevB.46.9620
- (1992) Phys. Rev. B , vol.46 , pp. 9620
- Davies, J.H.¹ Hyldgaard, P.² Hershfield, S.³ Wilkins, J.W.⁴

5
- 0000222689
- PRLTAO 0031-9007 10.1103/PhysRevLett.65.2901
- M. Buttiker, Phys. Rev. Lett. 65, 2901 (1990). PRLTAO 0031-9007 10.1103/PhysRevLett.65.2901
- (1990) Phys. Rev. Lett. , vol.65 , pp. 2901
- Buttiker, M.¹

6
- 0000698805
- PRLTAO 0031-9007 10.1103/PhysRevLett.73.134
- Y.V. Nazarov, Phys. Rev. Lett. 73, 134 (1994). PRLTAO 0031-9007 10.1103/PhysRevLett.73.134
- (1994) Phys. Rev. Lett. , vol.73 , pp. 134
- Nazarov, Y.V.¹

7
- 4143134969
- PRLTAO 0031-9007 10.1103/PhysRevLett.80.1054
- G. Iannaccone, G. Lombardi, M. Macucci, and B. Pellegrini, Phys. Rev. Lett. 80, 1054 (1998). PRLTAO 0031-9007 10.1103/PhysRevLett.80.1054
- (1998) Phys. Rev. Lett. , vol.80 , pp. 1054
- Iannaccone, G.¹ Lombardi, G.² MacUcci, M.³ Pellegrini, B.⁴

8
- 84922644221
- IETDAI 0018-9383
- R.J. McIntyre, IEEE Trans. Electron Devices IETDAI 0018-9383 13, 164 (1966).
- (1966) IEEE Trans. Electron Devices , vol.13 , pp. 164
- McIntyre, R.J.¹

9
- 0033169534
- IETDAI 0018-9383 10.1109/16.777150
- R.J. McIntyre, IEEE Trans. Electron Devices IETDAI 0018-9383 46, 1623 (1999). 10.1109/16.777150
- (1999) IEEE Trans. Electron Devices , vol.46 , pp. 1623
- McIntyre, R.J.¹

10
- 0033169533
- IETDAI 0018-9383 10.1109/16.777151
- P. Yuan, IEEE Trans. Electron Devices IETDAI 0018-9383 46, 1632 (1999). 10.1109/16.777151
- (1999) IEEE Trans. Electron Devices , vol.46 , pp. 1632
- Yuan, P.¹

11
- 0032188252
- IETDAI 0018-9383 10.1109/16.725242
- K.F. Li, IEEE Trans. Electron Devices IETDAI 0018-9383 45, 2102 (1998). 10.1109/16.725242
- (1998) IEEE Trans. Electron Devices , vol.45 , pp. 2102
- Li, K.F.¹

12
- 0026839191
- IETDAI 0018-9383 10.1109/16.123476
- M.M. Hayat, B.E.A. Saleh, and M.C. Teich, IEEE Trans. Electron Devices IETDAI 0018-9383 39, 546 (1992). 10.1109/16.123476
- (1992) IEEE Trans. Electron Devices , vol.39 , pp. 546
- Hayat, M.M.¹ Saleh, B.E.A.² Teich, M.C.³

13
- 0001282097
- JAPIAU 0021-8979 10.1063/1.367111
- D.S. Ong, J. Appl. Phys. 83, 3426 (1998). JAPIAU 0021-8979 10.1063/1.367111
- (1998) J. Appl. Phys. , vol.83 , pp. 3426
- Ong, D.S.¹

14
- 0037318469
- IEJQA7 0018-9197 10.1109/JQE.2002.807183
- S. Wang, IEEE J. Quantum Electron. 39, 375 (2003). IEJQA7 0018-9197 10.1109/JQE.2002.807183
- (2003) IEEE J. Quantum Electron. , vol.39 , pp. 375
- Wang, S.¹

15
- 0003768306
- John Wiley & Sons, New York
- A. van der Ziel, Noise in Measurements (John Wiley & Sons, New York, 1976).
- (1976) Noise in Measurements
- Van Der Ziel, A.¹

16
- 12044256667
- PRLTAO. 0031-9007. 10.1103/PhysRevLett.67.580
- H. Kühn and D.-G. Welsch, Phys. Rev. Lett. 67, 580 (1991). PRLTAO 0031-9007 10.1103/PhysRevLett.67.580
- (1991) Phys. Rev. Lett. , vol.67 , pp. 580
- Kühn, H.¹ Welsch, D.-G.²

17
- 36149010770
- PHRVAO 0031-899X 10.1103/PhysRev.72.26
- U. Fano, Phys. Rev. PHRVAO 0031-899X 72, 26 (1947). 10.1103/PhysRev.72.26
- (1947) Phys. Rev. , vol.72 , pp. 26
- Fano, U.¹

18
- 18744375149
- JAPIAU 0021-8979 10.1063/1.1505987
- F. Ma, J. Appl. Phys. 92, 4791 (2002). JAPIAU 0021-8979 10.1063/1.1505987
- (2002) J. Appl. Phys. , vol.92 , pp. 4791
- Ma, F.¹

19
- 0001646296
- JAPIAU 0021-8979 10.1063/1.368656
- C.K. Chia, J. Appl. Phys. 84, 4363 (1998). JAPIAU 0021-8979 10.1063/1.368656
- (1998) J. Appl. Phys. , vol.84 , pp. 4363
- Chia, C.K.¹

20
- 0028547277
- IETDAI 0018-9383 10.1109/16.333807
- L. Varani, IEEE Trans. Electron Devices 41, 1916 (1994). IETDAI 0018-9383 10.1109/16.333807
- (1994) IEEE Trans. Electron Devices , vol.41 , pp. 1916
- Varani, L.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.