Shot noise by quantum scattering in chaotic cavities

Physical Review Letters

Volumn 86, Issue 10, 2001, Pages 2114-2117

  Oberholzer, S ^a   Sukhorukov, E V ^a   Strunk, C ^a,d   Schonenberger C ^a   Heinzel, T ^b   Holland, M ^c  

^a UNIVERSITY OF BASEL   (Switzerland)

^b ETH ZURICH   (Switzerland)

^c UNIVERSITY OF GLASGOW   (United Kingdom)

^d UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHAOS THEORY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; NUMERICAL ANALYSIS; NYQUIST DIAGRAMS; POINT CONTACTS; QUANTUM THEORY; SHOT NOISE; SPECTRUM ANALYSIS;

CHAOTIC CAVITIES; ELECTRON-ELECTRON INTERACTIONS; FANO FACTOR; QUANTUM RESISTANCE; QUANTUM SCATTERING; THOMAS-FERMI SCREENING;

ELECTRON SCATTERING;

EID: 6644224009     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.2114     Document Type: Article

References (25)

1. For a recent review, see Ya. M. Blanter and M. Büttiker, Phys. Rep. 336, 1 (2000).
2. G. B. Lesovik, JETP Lett. 49, 592 (1989).
3. M. Büttiker, Phys. Rev. Lett. 65, 2901 (1990).
4. R. A. Jalabert, J.-L. Pichard, and C. W. J. Beenakker, Europhys. Lett. 27, 255 (1994).
5. Ya. M. Blanter and E. V. Sukhorukov, Phys. Rev. Lett. 84, 1280 (2000).
6. C. W. J. Beenakker and M. Büttiker, Phys. Rev. B 46, 1889 (1992); K. E. Nagaev, Phys. Lett. A 169, 103 (1992).
7. C. W. J. Beenakker and M. Büttiker, Phys. Rev. B 46, 1889 (1992); K. E. Nagaev, Phys. Lett. A 169, 103 (1992).
8. R. J. Schoelkopf et al., Phys. Rev. Lett. 78, 3370 (1997).
9. M. Henny, S. Oberholzer, C. Strunk, and C. Schönenberger, Phys. Rev. B 59, 2871 (1999).
10. Yu. V. Nazarov, Phys. Rev. Lett. 73, 134 (1994).
11. E. V. Sukhorukov and D. Loss, Phys. Rev. Lett. 80, 4959 (1998).
12. B. J. van Wees et al., Phys. Rev. Lett. 60, 848 (1988); D. A. Wharam et al., J. Phys. C 21, L209 (1988).
13. B. J. van Wees et al., Phys. Rev. Lett. 60, 848 (1988); D. A. Wharam et al., J. Phys. C 21, L209 (1988).
14. R. Landauer, IBM J. Res. Dev. 1, 223 (1957).
15. A. G. Huibers, M. Switkes, C. M. Marcus, K. Campman, and A. C. Gossard, Phys. Rev. Lett. 81, 200 (1998).
16. 0.
17. A. Kumar, L. Saminadayar, D. C. Glattli, Y Jin, and B. Etienne, Phys. Rev. Lett. 76, 2778 (1996).
18. L. P. Kouwenhoven et al., Phys. Rev. B 39, 8040 (1989).
19. K. E. Nagaev, Phys. Rev. B 52, 4740 (1995); V. I. Kozub and A. M. Rudin, Phys. Rev. B 52, 7853 (1995); A. H. Steinbach, J. M. Martinis, and M. H. Devoret, Phys. Rev. Lett. 76, 3806 (1996).
20. K. E. Nagaev, Phys. Rev. B 52, 4740 (1995); V. I. Kozub and A. M. Rudin, Phys. Rev. B 52, 7853 (1995); A. H. Steinbach, J. M. Martinis, and M. H. Devoret, Phys. Rev. Lett. 76, 3806 (1996).
21. K. E. Nagaev, Phys. Rev. B 52, 4740 (1995); V. I. Kozub and A. M. Rudin, Phys. Rev. B 52, 7853 (1995); A. H. Steinbach, J. M. Martinis, and M. H. Devoret, Phys. Rev. Lett. 76, 3806 (1996).
22. M. J. M. de Jong and C. W. J. Beenakker, in Mesoscopic Electron Transport, edited by L. P. Kouwenhoven, G. Schön, and L. L. Sohn, NATO ASI, Series E, Vol. 345 (Kluwer Academic, Dordrecht, 1996).
23. G. F. Giuliani and J. J. Quinn, Phys. Rev. B 26, 4421 (1982).
24. -1.
25. O. Agam, I. Aleiner, and A. Larkin, Phys. Rev. Lett. 85, 3153 (2000).